| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Analysis of the interaction of an electron beam with a solar cell—I
|
Von Roos, Oldwig
|
|
1978
|
21 |
8 |
p. 1063-1067
5 p.
|
artikel
|
| 2 |
Analysis of the interaction of an electron beam with a solar cell—II
|
von Roos, Oldwig
|
|
1978
|
21 |
8 |
p. 1069-1077
9 p.
|
artikel
|
| 3 |
A simple analysis of CCDs driven by pn junctions
|
Kleefstra, M.
|
|
1978
|
21 |
8 |
p. 1005-1011
7 p.
|
artikel
|
| 4 |
A van der Pauw resistor structure for determining mask superposition errors on semiconductor slices
|
Perloff, David S.
|
|
1978
|
21 |
8 |
p. 1013-1018
6 p.
|
artikel
|
| 5 |
Characteristics of burst noise intermittency
|
Knott, K.F.
|
|
1978
|
21 |
8 |
p. 1039-1043
5 p.
|
artikel
|
| 6 |
Conduction properties of lightly doped, polycrystalline silicon
|
Korsh, George J.
|
|
1978
|
21 |
8 |
p. 1045-1051
7 p.
|
artikel
|
| 7 |
Determination of base recombination lifetime and surface recombination velocity at N−N + interface of epitaxial transistors
|
Srivastava, A.
|
|
1978
|
21 |
8 |
p. 1089-1090
2 p.
|
artikel
|
| 8 |
Flicker noise due to grain boundaries in n-type Hg1−xCdxTe
|
Hanafi, H.I.
|
|
1978
|
21 |
8 |
p. 1019-1021
3 p.
|
artikel
|
| 9 |
Graphical technique to determine minority carrier lifetime and surface generation velocity using triangular-voltage sweep C-V method
|
Taniguchi, K.
|
|
1978
|
21 |
8 |
p. 1057-1061
5 p.
|
artikel
|
| 10 |
Low frequency noise in junction field effect transistors
|
Kandiah, K.
|
|
1978
|
21 |
8 |
p. 1079-1088
10 p.
|
artikel
|
| 11 |
Measurement of minority carrier lifetime and diffusion length in silicon epitaxial layers by means of the photocurrent technique
|
Müller, J.
|
|
1978
|
21 |
8 |
p. 999-1003
5 p.
|
artikel
|
| 12 |
Negative resistance in Zener diodes
|
Biswas, J.C.
|
|
1978
|
21 |
8 |
p. 1053-1055
3 p.
|
artikel
|
| 13 |
Recombination level selection criteria for lifetime reduction in integrated circuits
|
Baliga, B.Jayant
|
|
1978
|
21 |
8 |
p. 1033-1038
6 p.
|
artikel
|
| 14 |
Redistribution of dopant impurities in a semiconductor using the series method of Chen and Chen
|
Hill, Anthony C.
|
|
1978
|
21 |
8 |
p. 1025-1031
7 p.
|
artikel
|
| 15 |
The high-injection transmission line model of p−n diode and p−n−p transistor noise
|
van der Ziel, A.
|
|
1978
|
21 |
8 |
p. 1023-1024
2 p.
|
artikel
|
| 16 |
The transient behavior of temperature in IMPATT diodes
|
Lonngren, Karl E.
|
|
1978
|
21 |
8 |
p. 1091-1094
4 p.
|
artikel
|
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