| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A model for doped-oxide-source diffusion with a chemical reaction at the silicon-silicon dioxide interface
|
Chakrabarti, Utpal Kr.
|
|
1977
|
20 |
2 |
p. 111-112
2 p.
|
artikel
|
| 2 |
Analysis of silicon solar cells with stripe geometry junctions
|
Hu, Chenming
|
|
1977
|
20 |
2 |
p. 119-123
5 p.
|
artikel
|
| 3 |
A new technique for fabrication of Schottky barrier diodes
|
D. Stareev, Georgi
|
|
1977
|
20 |
2 |
p. 161-163
3 p.
|
artikel
|
| 4 |
A review of some charge transport properties of silicon
|
Jacoboni, C.
|
|
1977
|
20 |
2 |
p. 77-89
13 p.
|
artikel
|
| 5 |
A time-domain analysis of CCD video integrators
|
Chowaniec, A.
|
|
1977
|
20 |
2 |
p. 153-157
5 p.
|
artikel
|
| 6 |
Characteristics of Cr-SiO2-nSi tunnel diodes
|
Kumar, Vikram
|
|
1977
|
20 |
2 |
p. 143-152
10 p.
|
artikel
|
| 7 |
Editorial announcement
|
|
|
1977
|
20 |
2 |
p. I-
1 p.
|
artikel
|
| 8 |
Hall effect in a non homogeneous magnetic field
|
de Mey, G.
|
|
1977
|
20 |
2 |
p. 139-142
4 p.
|
artikel
|
| 9 |
High efficiency n-CdS/p-InP solar cells prepared by the close-spaced technique
|
Yoshikawa, Akihiko
|
|
1977
|
20 |
2 |
p. 133-134
2 p.
|
artikel
|
| 10 |
Interface state density in Au-nGaAs Schottky diodes
|
Borrego, J.M.
|
|
1977
|
20 |
2 |
p. 125-132
8 p.
|
artikel
|
| 11 |
Measurement of minority carrier lifetime profiles in silicon
|
Schwab, G.
|
|
1977
|
20 |
2 |
p. 91-94
4 p.
|
artikel
|
| 12 |
Minority carrier injection into heavily doped silicon
|
Slotboom, J.W.
|
|
1977
|
20 |
2 |
p. 167-170
4 p.
|
artikel
|
| 13 |
Noise in ion implanted integrated circuit resistors
|
Hsieh, K.C.
|
|
1977
|
20 |
2 |
p. 164-165
2 p.
|
artikel
|
| 14 |
Optimization of varicap diode design
|
D. Stareev, Georgi
|
|
1977
|
20 |
2 |
p. 159-161
3 p.
|
artikel
|
| 15 |
Silicon solar cells using natural inversion layers found in thermally-oxidized p-silicon
|
Salter, G.C.
|
|
1977
|
20 |
2 |
p. 95-104
10 p.
|
artikel
|
| 16 |
The energy levels of palladium in silicon
|
So, Lingkon
|
|
1977
|
20 |
2 |
p. 113-117
5 p.
|
artikel
|
| 17 |
Two dimensional plotting of semiconductor resistivity by scanning electron microscope
|
Kamm, J.D.
|
|
1977
|
20 |
2 |
p. 105-106
2 p.
|
artikel
|
Tijdschrift beschrijving