nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A compensation law for reverse-biassed ZnSe Schottky diodes
|
Wilson, J.I.B. |
|
1975 |
18 |
9 |
p. 759-761 3 p. |
artikel |
2 |
A method for calculating band profile and capacitance of nonuniformly doped Schottky barriers
|
Lubberts, G. |
|
1975 |
18 |
9 |
p. 805-809 5 p. |
artikel |
3 |
A model of ohmic contacts to semiconductors
|
Pellegrini, B. |
|
1975 |
18 |
9 |
p. 791-798 8 p. |
artikel |
4 |
Carrier temperature effects in a p−n junction
|
Stokoe, T.Y. |
|
1975 |
18 |
9 |
p. 811-814 4 p. |
artikel |
5 |
Characteristics of enhancement/depletion (E/D) gate MOSFET fabricated using ion implantation
|
Sasaki, Nobuo |
|
1975 |
18 |
9 |
p. 777-783 7 p. |
artikel |
6 |
Collection efficiency and transfer characteristics of CID image sensors
|
Anagnostopoulos, C. |
|
1975 |
18 |
9 |
p. 771-776 6 p. |
artikel |
7 |
Equation formulation considerations for efficient numerical modeling of semiconductor phenomena
|
McAfee Jr., Leo C. |
|
1975 |
18 |
9 |
p. 799-804 6 p. |
artikel |
8 |
Frequency response of the current multiplication process in MIS tunnel diodes
|
Green, M.A. |
|
1975 |
18 |
9 |
p. 745-752 8 p. |
artikel |
9 |
Ge doped GaAs double heterojunction lasers with Si compensation
|
Ashley, K.L. |
|
1975 |
18 |
9 |
p. 815-816 2 p. |
artikel |
10 |
Interface charge characteristics of MOS structures with different metals on steam grown oxides
|
Kar, S. |
|
1975 |
18 |
9 |
p. 723-732 10 p. |
artikel |
11 |
Low frequency conductance and capacitance measurements on MOS capacitors in weak inversion
|
Saks, N.S. |
|
1975 |
18 |
9 |
p. 737-744 8 p. |
artikel |
12 |
Planar InSb photodiodes fabricated by Be and Mg ion implantation
|
Hurwitz, C.E. |
|
1975 |
18 |
9 |
p. 753-756 4 p. |
artikel |
13 |
Solubility of gold in p-type silicon
|
Brown, Margaret |
|
1975 |
18 |
9 |
p. 763-770 8 p. |
artikel |
14 |
Stromverstärkung in ZnSe/CdSe-photoleiterschichten
|
Berger, Klaus |
|
1975 |
18 |
9 |
p. 785-789 5 p. |
artikel |
15 |
The role of elevated temperatures in the implantation of GaAs
|
Davies, D.Eirug |
|
1975 |
18 |
9 |
p. 733-736 4 p. |
artikel |
16 |
The variation of impurity ionization with doping in heavily doped germanium
|
Roy, D.K. |
|
1975 |
18 |
9 |
p. 757-758 2 p. |
artikel |