nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Aluminum-silicon Schottky barriers as semiconductor targets for EBS devices
|
Namordi, M.R. |
|
1975 |
18 |
6 |
p. 499-508 10 p. |
artikel |
2 |
Analysis of modified lateral PNP transistors
|
DeMassa, T.A. |
|
1975 |
18 |
6 |
p. 481-490 10 p. |
artikel |
3 |
A review of the theory and technology for ohmic contacts to group III–V compound semiconductors
|
Rideout, V.L. |
|
1975 |
18 |
6 |
p. 541-550 10 p. |
artikel |
4 |
A theoretical and experimental study of recombination in silicon p−n junctions
|
Ashburn, P. |
|
1975 |
18 |
6 |
p. 569-577 9 p. |
artikel |
5 |
Boron diffusion in polycrystalline silicon layers
|
Horiuchi, S. |
|
1975 |
18 |
6 |
p. 529-532 4 p. |
artikel |
6 |
Calculation of the switching time in junction diodes
|
de Smet, L. |
|
1975 |
18 |
6 |
p. 557-562 6 p. |
artikel |
7 |
Electroluminescence in zinc selenide
|
Özsan, M.E. |
|
1975 |
18 |
6 |
p. 519-527 9 p. |
artikel |
8 |
Electron mobility empirically related to the phosphorus concentration in silicon
|
Baccarani, G. |
|
1975 |
18 |
6 |
p. 579-580 2 p. |
artikel |
9 |
Energy levels and concentrations for platinum in silicon
|
Lisiak, K.P. |
|
1975 |
18 |
6 |
p. 533-540 8 p. |
artikel |
10 |
On the time dependency of the avalanche process in semiconductors
|
Walma, Alle A. |
|
1975 |
18 |
6 |
p. 511-517 7 p. |
artikel |
11 |
Properties of compensated GaAs light-emitting diodes following 60Co irradiation
|
Share, Stewart |
|
1975 |
18 |
6 |
p. 471-480 10 p. |
artikel |
12 |
Solid state thermal control for spacecraft
|
Harpster, Joseph W.C. |
|
1975 |
18 |
6 |
p. 551-555 5 p. |
artikel |
13 |
Thermal noise in ion-implanted MOSFETs
|
Huang, C. |
|
1975 |
18 |
6 |
p. 509-510 2 p. |
artikel |
14 |
The small signal admittance of carbon implanted p-n diodes
|
Howes, M.J. |
|
1975 |
18 |
6 |
p. 491-497 7 p. |
artikel |
15 |
Unipolar current transport through metal-insulator-metal (MIM) structures, supplied with barrier contacts, in the diffusion limit
|
Cisneros, Gerardo |
|
1975 |
18 |
6 |
p. 563-568 6 p. |
artikel |
16 |
Use of Ehrenberg's approximation in analytical solution of semiconductor barriers in weak inversion and accumulation
|
Hampshire, M.J. |
|
1975 |
18 |
6 |
p. 580-581 2 p. |
artikel |