nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A computer study of power-limiter diode behavior
|
Kurata, Mamoru |
|
1974 |
17 |
9 |
p. 951-961 11 p. |
artikel |
2 |
Application of the small-signal transmission line equivalent circuit model to the a.c., d.c. and transient analysis of semiconductor devices
|
Green, M.A. |
|
1974 |
17 |
9 |
p. 941-949 9 p. |
artikel |
3 |
Avalanche-injected electron currents in SiO2 at high injection densities
|
Verwey, J.F. |
|
1974 |
17 |
9 |
p. 963-971 9 p. |
artikel |
4 |
Avalanche multiplication in GaSb pn-junctions
|
Haecker, Walter |
|
1974 |
17 |
9 |
p. 993-994 2 p. |
artikel |
5 |
Calculations of collector current variation in bipolar transistors
|
Poon, H.C. |
|
1974 |
17 |
9 |
p. 973-975 3 p. |
artikel |
6 |
Determination of the electric field in a Hall generator under influence of an alternating magnetic field
|
de Mey, G. |
|
1974 |
17 |
9 |
p. 977-979 3 p. |
artikel |
7 |
Erratum
|
|
|
1974 |
17 |
9 |
p. 1000- 1 p. |
artikel |
8 |
Forward I-V characteristics of Pt/n-GaAs Schottky barrier contacts
|
Murarka, Shyam P. |
|
1974 |
17 |
9 |
p. 985-991 7 p. |
artikel |
9 |
Frequency and temperature dependence of the small signal capacitance of reverse biased if GaP/Zn,O/p-n junctions
|
Ferenczi, G. |
|
1974 |
17 |
9 |
p. 897-902 6 p. |
artikel |
10 |
Influence of carriers on the capacitance of p-n junctions with deep donors
|
Smiljanić, M. |
|
1974 |
17 |
9 |
p. 931-939 9 p. |
artikel |
11 |
Influence of clock waveforms on the performance of charge coupled devices
|
Brotherton, S.D. |
|
1974 |
17 |
9 |
p. 981-984 4 p. |
artikel |
12 |
Investigation of the anomalous photovoltage in CdTe films
|
Quartly, J.R. |
|
1974 |
17 |
9 |
p. 998-IN2 nvt p. |
artikel |
13 |
On the initial value of transient photocurrents in silicon
|
Norde, H. |
|
1974 |
17 |
9 |
p. 996-998 3 p. |
artikel |
14 |
Spectroscopy of impurity levels by measuring the microplasma turn on probabilities in GaP/Zn,O/diodes
|
Ferenczi, G. |
|
1974 |
17 |
9 |
p. 903-911 9 p. |
artikel |
15 |
Surface breakdown in silicon planar junctions—A computer-aided experimental determination of the critical field
|
Bulucea, C. |
|
1974 |
17 |
9 |
p. 881-888 8 p. |
artikel |
16 |
Surface-state spectra from thick-oxide MOS tunnel junctions
|
Ma, T.P. |
|
1974 |
17 |
9 |
p. 913-929 17 p. |
artikel |
17 |
The measurement of the charge residual for CCD transfer using impulse and frequency responses
|
Vanstone, G.F. |
|
1974 |
17 |
9 |
p. 889-895 7 p. |
artikel |
18 |
The optical writing of MNOS memory with Au deep traps
|
Koike, S. |
|
1974 |
17 |
9 |
p. 994-996 3 p. |
artikel |