nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
An investigation of the effect of two-band model of the barrier on the tunnelling characteristics of degenerate MIS diodes
|
Temple, V.A.K. |
|
1974 |
17 |
5 |
p. 417-426 10 p. |
artikel |
2 |
Auger-rekombination im mittelgebiet durchlassbelasteter silizium-gleichrichter und -thyristoren
|
Krausse, J. |
|
1974 |
17 |
5 |
p. 427-429 3 p. |
artikel |
3 |
Effective distribution coefficients of some group VI elements in indium phosphide grown by liquid phase epitaxy
|
Brown, Kenneth E. |
|
1974 |
17 |
5 |
p. 505-507 3 p. |
artikel |
4 |
Effect of injection efficiency and dimensions on the performance of a forward biased P +−I alloyed junction
|
Jain, G.C. |
|
1974 |
17 |
5 |
p. 431-438 8 p. |
artikel |
5 |
Effect of spot size on the determination of the diffusion length of minority carriers in p−n junctions using scanned light- or electron-beam techniques
|
Lengyel, Gabriel |
|
1974 |
17 |
5 |
p. 510-512 3 p. |
artikel |
6 |
Electronic properties of undoped polycrystalline silicon
|
Muñoz, E. |
|
1974 |
17 |
5 |
p. 439-446 8 p. |
artikel |
7 |
Error analysis of high-frequency MOS capacitance calculations
|
Brews, J.R. |
|
1974 |
17 |
5 |
p. 447-456 10 p. |
artikel |
8 |
Factors affecting avalanche injection into insulating layers from a semiconductor surface
|
Card, H.C. |
|
1974 |
17 |
5 |
p. 501-502 2 p. |
artikel |
9 |
Gate-enhanced vs channel-current induced breakdown for floating gate avalanche injection
|
Müller, R.G. |
|
1974 |
17 |
5 |
p. 503-505 3 p. |
artikel |
10 |
Inclusion of carrier temperature effects in a thermionic-diffusion theory of the schottky barrier
|
Stokoe, T.Y. |
|
1974 |
17 |
5 |
p. 477-484 8 p. |
artikel |
11 |
Numerical methods for the charge transfer analysis of charge-coupled devices
|
Chan, C.H. |
|
1974 |
17 |
5 |
p. 491-499 9 p. |
artikel |
12 |
Space-charge-limited (SCL) effects in thin, Cu compensated CdS structures
|
McGarthy, S.J. |
|
1974 |
17 |
5 |
p. 485-489 5 p. |
artikel |
13 |
Temperature dependence of the tunnel current in sandwiches: Does the barrier change with temperature?
|
Kadlec, J. |
|
1974 |
17 |
5 |
p. 469-475 7 p. |
artikel |
14 |
The built-in voltage and space charge layer capacitance of p−n junctions
|
Kuźmicz, Wieslaw |
|
1974 |
17 |
5 |
p. 457-463 7 p. |
artikel |
15 |
The emitter-base breakdown voltage of planar transistors
|
Wilson, P.R. |
|
1974 |
17 |
5 |
p. 465-467 3 p. |
artikel |
16 |
Transit time in the base region of drift transistors considering recombination and variable mobility
|
El-Shandwily, M.E. |
|
1974 |
17 |
5 |
p. 507-509 3 p. |
artikel |