nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A ‘four parameters’ model that fits the degradation curve ΔV G (V G ) of MOS transistors under irradiation
|
Buxo, J. |
|
1972 |
15 |
9 |
p. 1029-1031 3 p. |
artikel |
2 |
Analysis of large-signal noise in read oscillators
|
Sjölund, A. |
|
1972 |
15 |
9 |
p. 971-978 8 p. |
artikel |
3 |
A simplified computational treatment of recombination centers in the transmission line equivalent circuit model of a semiconductor
|
Green, M.A. |
|
1972 |
15 |
9 |
p. 1027-1029 3 p. |
artikel |
4 |
A theoretical investigation on the generation current in silicon p-n junctions under reverse bias
|
Calzolari, P.U. |
|
1972 |
15 |
9 |
p. 1003-1011 9 p. |
artikel |
5 |
Carrier transport and storage effects in Au ion implanted SiO2 structures
|
Chen, L.I. |
|
1972 |
15 |
9 |
p. 979-986 8 p. |
artikel |
6 |
Conductance associated with interface states in MOS tunnel structures
|
Card, H.C. |
|
1972 |
15 |
9 |
p. 993-998 6 p. |
artikel |
7 |
Correlation of the Schottky barrier height measurements determined from the capacitance method and the saturation current
|
Hackam, R. |
|
1972 |
15 |
9 |
p. 1031-1032 2 p. |
artikel |
8 |
Determination of conduction anisotropies in semiconductors
|
Gaylord, T.K. |
|
1972 |
15 |
9 |
p. 953-960 8 p. |
artikel |
9 |
L'effet magnetovoltaïque de surface
|
Viktorovitch, P. |
|
1972 |
15 |
9 |
p. 1013-1021 9 p. |
artikel |
10 |
Observation on phenomena associated with a slowly varying surface barrier at niobium oxide and aluminum interface
|
Chiou, Y.L. |
|
1972 |
15 |
9 |
p. 999-1001 3 p. |
artikel |
11 |
Potential measurement and stabilization of an isolated target using electron beams
|
Kudirka, P.E. |
|
1972 |
15 |
9 |
p. 987-992 6 p. |
artikel |
12 |
SCL-MOST in the triode mode
|
Bandali, M.B. |
|
1972 |
15 |
9 |
p. 1023-1026 4 p. |
artikel |
13 |
The diffusion of boron in the SiSiO2 system
|
Wilson, P.R. |
|
1972 |
15 |
9 |
p. 961-970 10 p. |
artikel |