nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
An accurate two-dimensional numerical analysis of the MOS transistor
|
Vandorpe, D. |
|
1972 |
15 |
5 |
p. 547-557 11 p. |
artikel |
2 |
An integrated 11 MHz p-n-p-n shift register
|
Kasperkovitz, D. |
|
1972 |
15 |
5 |
p. 501-502 2 p. |
artikel |
3 |
An investigation of carrier transport in thin silicon-on-sapphire films using MIS deep depletion Hall effect structures
|
Elliot, A.B.M. |
|
1972 |
15 |
5 |
p. 531-534 4 p. |
artikel |
4 |
Announcement
|
|
|
1972 |
15 |
5 |
p. 600- 1 p. |
artikel |
5 |
A unified approach to the theory of current injection in solids with traps uniformly and non-uniformly distributed in space and in energy, and size effects in anthracene films
|
Hwang, W. |
|
1972 |
15 |
5 |
p. 523-529 7 p. |
artikel |
6 |
Der einfluss des basisbahnwiderstandes und der ladungsträgermultiplikation auf das ausgangskennlinienfeld von planartransistoren
|
Rein, H.M. |
|
1972 |
15 |
5 |
p. 481-482 2 p. |
artikel |
7 |
Four point probe Hall effect and resistivity measurements upon semiconductors
|
Green, M.A. |
|
1972 |
15 |
5 |
p. 577-585 9 p. |
artikel |
8 |
Interface states in SiSiO2 interfaces
|
Deuling, H. |
|
1972 |
15 |
5 |
p. 559-571 13 p. |
artikel |
9 |
Letter to the editor
|
Meaudre, R. |
|
1972 |
15 |
5 |
p. 599- 1 p. |
artikel |
10 |
On diode thermometers
|
Sclar, N. |
|
1972 |
15 |
5 |
p. 473-480 8 p. |
artikel |
11 |
Photodielectric effect in thin-film metal-CdTe-metal structures
|
Kneppo, I. |
|
1972 |
15 |
5 |
p. 587-593 7 p. |
artikel |
12 |
‘Pseudo’ current glow curves in crystals
|
Katzir, A. |
|
1972 |
15 |
5 |
p. 573-575 3 p. |
artikel |
13 |
Stable germanium dioxide films on germanium
|
Kuisl, M. |
|
1972 |
15 |
5 |
p. 595-596 2 p. |
artikel |
14 |
Theoretical performance of the schottky barrier power rectifier
|
Page, D.J. |
|
1972 |
15 |
5 |
p. 505-515 11 p. |
artikel |
15 |
Trends in the end conductance of CW Gunn oscillators
|
Charlton, R.W. |
|
1972 |
15 |
5 |
p. 517-518 2 p. |
artikel |