nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A distributed gate bistable MOS transistor
|
Fu, H.S. |
|
1971 |
14 |
9 |
p. 799-804 6 p. |
artikel |
2 |
An improved microwave silicon MESFET
|
Baechtold, W. |
|
1971 |
14 |
9 |
p. 783-790 8 p. |
artikel |
3 |
An investigation of lateral transistors -d.c. characteristics
|
Chou, Sunlin |
|
1971 |
14 |
9 |
p. 811-826 16 p. |
artikel |
4 |
Carrier generation rate and effective lifetime in InSb thin films
|
Lile, Derek L. |
|
1971 |
14 |
9 |
p. 855-863 9 p. |
artikel |
5 |
Electromagnetic theory of heterostructure injection lasers
|
Adams, M.J. |
|
1971 |
14 |
9 |
p. 865-883 19 p. |
artikel |
6 |
Flash X-ray irradiation of P-N junctions: A method to measure minority carrier lifetimes, diffusion constants and generation constants
|
Lindström, J.L. |
|
1971 |
14 |
9 |
p. 827-833 7 p. |
artikel |
7 |
Hot electron transport and emission in Au-SiO-Au thin film cathodes
|
Collins, R.A. |
|
1971 |
14 |
9 |
p. 805-810 6 p. |
artikel |
8 |
Improved ohmic contacts to n-type GaP devices
|
Nakatsuka, H. |
|
1971 |
14 |
9 |
p. 849-853 5 p. |
artikel |
9 |
On the emitter degradation by avalanche breakdown in planar transistors
|
Verwey, J.F. |
|
1971 |
14 |
9 |
p. 775-782 8 p. |
artikel |
10 |
On the hysteresis and memory properties of the silicon-silicon nitride system
|
Kendall, E.J.M. |
|
1971 |
14 |
9 |
p. 791-798 8 p. |
artikel |
11 |
On the mechanism of ovonic threshold switching
|
Henisch, H.K. |
|
1971 |
14 |
9 |
p. 765-774 10 p. |
artikel |
12 |
Reformulation of basic semiconductor transport equations
|
Parrott, J.E. |
|
1971 |
14 |
9 |
p. 885-899 15 p. |
artikel |
13 |
The influence of doping gradient on temperature dependence of threshold current density of GaAs-injection lasers
|
Salathé, R. |
|
1971 |
14 |
9 |
p. 843-847 5 p. |
artikel |
14 |
The investigation of phosphorus diffusion in evacuated, sealed tubes using tracer methods
|
Fränz, I. |
|
1971 |
14 |
9 |
p. 835-841 7 p. |
artikel |