nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A VAMFO-CARIS method for determining thickness of transparent films with small number of interference extrema
|
Jordanov, B. |
|
1971 |
14 |
8 |
p. 753-756 4 p. |
artikel |
2 |
Doping dependence of second breakdown in a p-n junction
|
Chen, H.C. |
|
1971 |
14 |
8 |
p. 747-751 5 p. |
artikel |
3 |
Effect of oxygen on GaP solar cell characteristics
|
Epstein, A.S. |
|
1971 |
14 |
8 |
p. 757-760 4 p. |
artikel |
4 |
Electronic processes in Cu x SCdS photovoltaic cells
|
Lindmayer, J. |
|
1971 |
14 |
8 |
p. 647-654 8 p. |
artikel |
5 |
Excess surface currents in p-n junctions and bipolar transistors
|
Esteve, D. |
|
1971 |
14 |
8 |
p. 693-705 13 p. |
artikel |
6 |
Experimental results on transient space charge limited currents in p-n junctions
|
Canali, C. |
|
1971 |
14 |
8 |
p. 661-666 6 p. |
artikel |
7 |
In-process control of interface properties in the diode array camera tube target
|
Gibbon, C.F. |
|
1971 |
14 |
8 |
p. 707-721 15 p. |
artikel |
8 |
Noise of hot holes in space-charge-limited germanium diodes
|
Nicolet, M-A. |
|
1971 |
14 |
8 |
p. 667-675 9 p. |
artikel |
9 |
Pinch-off in insulated-gate field effect transistors
|
Armstrong, G.A. |
|
1971 |
14 |
8 |
p. 760-764 5 p. |
artikel |
10 |
The distribution of mobile carriers in the pinch-off region of an insulated-gate field-effect transistor and its influence on device breakdown
|
Armstrong, G.A. |
|
1971 |
14 |
8 |
p. 723-733 11 p. |
artikel |
11 |
Turn-off transient behaviour of p-i-n diodes
|
Varshney, R.C. |
|
1971 |
14 |
8 |
p. 735-740 6 p. |
artikel |
12 |
Variable hue GaP diodes
|
Rosenzweig, W. |
|
1971 |
14 |
8 |
p. 655-660 6 p. |
artikel |
13 |
Variations de l'impedance d'un cristal de type N, soumis a une polarisation continue. Existence d'un maximum de la capacite differentielle
|
Meaudre, R. |
|
1971 |
14 |
8 |
p. 685-691 7 p. |
artikel |
14 |
Zero-bias contact resistances of AuGaAs Schottky barriers
|
McColl, M. |
|
1971 |
14 |
8 |
p. 677-683 7 p. |
artikel |