nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
An experimental verification of the electrostatic field gradient theory for diffused semiconductors
|
Jain, G.C. |
|
1971 |
14 |
10 |
p. 1015-1021 7 p. |
artikel |
2 |
Aspects of planar gunn diodes for high CW output power
|
Fallmann, W.F. |
|
1971 |
14 |
10 |
p. 909-912 4 p. |
artikel |
3 |
Carrier density fluctuation noise in silicon junction field effect transistors at low temperatures
|
Churchill, M.J. |
|
1971 |
14 |
10 |
p. 985-993 9 p. |
artikel |
4 |
Characteristics of an acousto-electric oscillator in the presence of a forcing electrical signal
|
Lahiri, S.K. |
|
1971 |
14 |
10 |
p. 1049-1053 5 p. |
artikel |
5 |
Einfluβ des dotierungsprofils auf die eigenschaften hypersensitiver kapazitätsvariationsdioden
|
Olk, G. |
|
1971 |
14 |
10 |
p. 913-928 16 p. |
artikel |
6 |
Formation of NiSi and current transport across the NiSi-Si interface
|
Andrews, J.M. |
|
1971 |
14 |
10 |
p. 901-908 8 p. |
artikel |
7 |
Grouping of microplasma switching transients in silicon reference diodes
|
Elms, M. |
|
1971 |
14 |
10 |
p. 1055-1057 3 p. |
artikel |
8 |
Induced gate noise in MOS FET's
|
Kirk, E.W. |
|
1971 |
14 |
10 |
p. 945-948 4 p. |
artikel |
9 |
Irradiation defects and the electrical quality of ion implanted silicon
|
Davies, D.Eirug |
|
1971 |
14 |
10 |
p. 975-983 9 p. |
artikel |
10 |
Low temperature noise in most amplifiers
|
Elliott, D.A. |
|
1971 |
14 |
10 |
p. 1041-1047 7 p. |
artikel |
11 |
Magnetic sensitivity of a MAGFET of uniform channel current density
|
Mohan Rao, G.R. |
|
1971 |
14 |
10 |
p. 995-1001 7 p. |
artikel |
12 |
Noise and y-parameters in mos fet's
|
Rao, P.S. |
|
1971 |
14 |
10 |
p. 939-944 6 p. |
artikel |
13 |
Non-equilibrium effects on metal-oxide-semiconductor tunnel currents
|
Clarke, R.A. |
|
1971 |
14 |
10 |
p. 957-973 17 p. |
artikel |
14 |
On the frequency response of Ge-magnetodiodes
|
Betko, J. |
|
1971 |
14 |
10 |
p. 1059-1060 2 p. |
artikel |
15 |
On the mechanism of switching effects in chalcogenide thin films
|
Suntola, T. |
|
1971 |
14 |
10 |
p. 933-938 6 p. |
artikel |
16 |
Optical phase shift measurement (77°K) of carrier decay time in direct GaAsP
|
Scifres, D.R. |
|
1971 |
14 |
10 |
p. 949-956 8 p. |
artikel |
17 |
Optical phase shift measurement of carrier decay-time on thin semiconductor samples with surface losses
|
Zwicker, H.R. |
|
1971 |
14 |
10 |
p. 1023-1033 11 p. |
artikel |
18 |
Permittivity of β-Ga2O3 at low frequencies
|
Hoeneisen, B. |
|
1971 |
14 |
10 |
p. 1057-1059 3 p. |
artikel |
19 |
Stresses and strains in a plate bonded to a substrate: Semiconductor devices
|
Zeyfang, R. |
|
1971 |
14 |
10 |
p. 1035-1039 5 p. |
artikel |
20 |
Structural and electrical properties of sublimed GaAs films
|
Yan, G. |
|
1971 |
14 |
10 |
p. 1003-1013 11 p. |
artikel |
21 |
Two components of 1/ƒ noise in mos transistors
|
Hawkins, R.J. |
|
1971 |
14 |
10 |
p. 929-932 4 p. |
artikel |