nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A two-dimensional model for the calculation of common-emitter current gains of lateral p-n-p transistors
|
Fulkerson, D.E. |
|
1968 |
11 |
9 |
p. 821-826 6 p. |
artikel |
2 |
Der einfluss adsorbierter metallischer verunreinigungen auf die kennwerte und die ausfallrate von siliziumgleichrichteranordnungen
|
Schmidt, H. |
|
1968 |
11 |
9 |
p. 827-832 6 p. |
artikel |
3 |
Effet de la dependance mobilite-champ electrique sur les caracteristiques du transistor a effet de champ a jonctions
|
David, P. |
|
1968 |
11 |
9 |
p. 893-901 9 p. |
artikel |
4 |
Electron mobility of sulfur-doped InSb films
|
Wieder, H.H. |
|
1968 |
11 |
9 |
p. 887-891 5 p. |
artikel |
5 |
Erratum
|
|
|
1968 |
11 |
9 |
p. 907- 1 p. |
artikel |
6 |
Gallium arsenide diode lasers with oblique angles between the resonator mirrors and the p-n junction
|
Deutsch, Ch. |
|
1968 |
11 |
9 |
p. 877-886 10 p. |
artikel |
7 |
Hall-effect isolator for v.h.f. range
|
Kobus, A. |
|
1968 |
11 |
9 |
p. 903-905 3 p. |
artikel |
8 |
Low frequency noise in MOS transistors—II Experiments
|
Christensson, S. |
|
1968 |
11 |
9 |
p. 813-820 8 p. |
artikel |
9 |
Low frequency noise in MOS transistors—I Theory
|
Christensson, S. |
|
1968 |
11 |
9 |
p. 797-812 16 p. |
artikel |
10 |
Theoretical threshold voltages for MOS field effect transistors
|
Richman, P. |
|
1968 |
11 |
9 |
p. 869-876 8 p. |
artikel |
11 |
Thermoelectricity and thermoelectric power generation
|
Rosi, F.D. |
|
1968 |
11 |
9 |
p. 833-848 16 p. |
artikel |