nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Analysis of an InAs thin film transistor
|
Kunig, H.E. |
|
1968 |
11 |
3 |
p. 335-342 8 p. |
artikel |
2 |
An MOS-oriented investigation of effective mobility theory
|
Pierret, R.F. |
|
1968 |
11 |
3 |
p. 279-290 12 p. |
artikel |
3 |
Dependence of the characteristics of MOS-transistors on the substrate resistivity
|
Das, M.B. |
|
1968 |
11 |
3 |
p. 305-322 18 p. |
artikel |
4 |
Determination of a physical model for double diffused transistors
|
Thomas, R.E. |
|
1968 |
11 |
3 |
p. 365-375 11 p. |
artikel |
5 |
Diffused diodes in silicon-on-sapphire
|
Dumin, D.J. |
|
1968 |
11 |
3 |
p. 353-363 11 p. |
artikel |
6 |
Effects of deep impurities on n + p junction reverse-biased small-signal capacitance
|
Schibli, E. |
|
1968 |
11 |
3 |
p. 323-334 12 p. |
artikel |
7 |
Erratum
|
|
|
1968 |
11 |
3 |
p. 383- 1 p. |
artikel |
8 |
InSb p +-n junctions in forward bias
|
Barber, H.D. |
|
1968 |
11 |
3 |
p. 343-352 10 p. |
artikel |
9 |
Metal-silicon Schottky barriers
|
Turner, M.J. |
|
1968 |
11 |
3 |
p. 291-300 10 p. |
artikel |
10 |
Photocapacitive effects at silicon-collodion-gold contacts
|
Lee, S. |
|
1968 |
11 |
3 |
p. 301-304 4 p. |
artikel |
11 |
Radiation dosimetry by current glow in diamond
|
Bose, D.N. |
|
1968 |
11 |
3 |
p. 273-278 6 p. |
artikel |
12 |
The capacitance of deep diffused planar junctions
|
Wilson, P.R. |
|
1968 |
11 |
3 |
p. 381-382 2 p. |
artikel |
13 |
Thermal noise in space-charge-limited solid-state diodes
|
Klaassen, F.M. |
|
1968 |
11 |
3 |
p. 377-378 2 p. |
artikel |
14 |
The use of a double photoresist technique in high frequency transistor fabrication
|
Thomas, G.R.M. |
|
1968 |
11 |
3 |
p. 378-381 4 p. |
artikel |