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Details for article 4 of 9 found articles
| Title: |
In-situ X-ray Microscopy of Crack-Propagation to Study Fracture Mechanics of On-Chip Interconnect Structures |
| Author: |
Kutukova, Kristina Liao, Zhongquan Werner, Stephan Guttmann, Peter Standke, Yvonne Gluch, Jürgen Schneider, Gerd Zschech, Ehrenfried |
| Appeared in: |
MRS advances |
| Paging: | Volume 3 () nr. 39 pages 2305-2310 |
| Year: |
2018-04-29 |
| Contents: | |
| Publisher: |
Springer International Publishing, Cham |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 9 found articles
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