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                                       Details for article 4 of 12 found articles
 
 
  In-situ High Temperature X-ray Diffraction Study of the Am-O System
 
 
Title: In-situ High Temperature X-ray Diffraction Study of the Am-O System
Author: Epifano, E.
Belin, R. C.
Richaud, J C
Vauchy, R.
Strach, M.
Lebreton, F.
Delahaye, T.
Guéneau, C.
Martin, P. M.
Appeared in: MRS advances
Paging: Volume 1 () nr. 62 pages 4133-4137
Year: 2017-02-16
Contents:
Publisher: Springer International Publishing, Cham
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 4 of 12 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands