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Journal description
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Details for article 3 of 9 found articles
| Title: |
Detecting faults in inner product masking scheme |
| Author: |
Cheng, Wei Carlet, Claude Goli, Kouassi Danger, Jean-Luc Guilley, Sylvain |
| Appeared in: |
Journal of cryptographic engineering |
| Paging: | Volume 11 () nr. 2 pages 119-133 |
| Year: |
2020-05-30 |
| Contents: | |
| Publisher: |
Springer Berlin Heidelberg, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 9 found articles
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