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                                       Details for article 30 of 196 found articles
 
 
  Criticality-based quantum metrology in the presence of decoherence
 
 
Title: Criticality-based quantum metrology in the presence of decoherence
Author: He, Wan-Ting
Lu, Cong-Wei
Yao, Yi-Xuan
Zhu, Hai-Yuan
Ai, Qing
Appeared in: Frontiers of physics
Paging: Volume 18 () nr. 3 pages xx
Year: 2023-04-18
Contents:
Publisher: Higher Education Press, Beijing
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 30 of 196 found articles
 
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