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Details van artikel 7 van 11 gevonden artikelen
| Titel: |
Optimisation of pattern recognition in textile field |
| Auteur: |
Ammor, O. Lachkar, A. Slaoui, K. Rais, N. |
| Verschenen in: |
The journal of the Textile Institute |
| Paginering: | Jaargang 99 (2008) nr. 3 pagina's 227-233 |
| Jaar: |
2008-06 |
| Inhoud: |
We introduce in this article a new formulation of cluster validity index, which allows us to find the correct number of clusters with high degree of overlap and then solve many problems in pattern recognition, machine learning, data mining, and so on. This new index can be used for several applications in different fields like medicine, marketing and especially in textile where colour image segmentation, image analysis processing and printed pattern have an important role. This measure is based on maximum entropy principle. Our approach does not require any parameter adjustment; it is, thereby, completely automatic. Many simulated and real examples are presented, showing the superiority of our measure to the existing ones. We show also an extension of this method to non-Gaussian mixture and its application to different forms with or without overlap. |
| Uitgever: |
Taylor & Francis |
| Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
Details van artikel 7 van 11 gevonden artikelen
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