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| Titel: |
Characterizing the thickness variations in ring spun yarns |
| Auteur: |
Huh, Y. Kim, J. S. Kim, S. H. Suh, M. W. |
| Verschenen in: |
The journal of the Textile Institute |
| Paginering: | Jaargang 96 (2005) nr. 6 pagina's 413-422 |
| Jaar: |
2005-02-01 |
| Inhoud: |
The quality of textile products is an important criterion for customers in determining whether to purchase a textile product or not. When a textile product reaches the level of mechanical and physicochemical properties needed as a quality product, its final criterion for marketability is made by its apparent quality. The visual quality of textile products is closely related to the irregularity of the constituent yarn thickness. This paper reports the results of a study on the thickness variation characteristics for various yarn types, that is, single staple yarn, two-plied yarn, and three-plied yarn, which look different when seen visually. For measuring yarn thickness variations we adopt the optoelectronic method based on a laser slit beam, which is among the several methods used for measuring yarn thickness, since the diameter of yarn cross-section provides new information on the thickness attributes that can influence the apparent quality of yarn and fabrics. For the purpose of characterizing the yarn thickness variations, we apply correlograms and variance—length curves. We can confirm that different types of yarns have their own unique thickness variation characteristics. Furthermore, it is identified that not only the thickness variance between the specimen lengths, but the total variance itself also changes according to the specimen length, that is, the sensor head size. We can estimate the ultimate thickness variance by using a curve-fitting method. |
| Uitgever: |
Taylor & Francis |
| Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
Details van artikel 49 van 225 gevonden artikelen
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