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  ON THE RESOLUTION OF H/V MEASUREMENTS TO DETERMINE SEDIMENT THICKNESS, A CASE STUDY ACROSS A NORMAL FAULT IN THE LOWER RHINE EMBAYMENT, GERMANY
 
 
Titel: ON THE RESOLUTION OF H/V MEASUREMENTS TO DETERMINE SEDIMENT THICKNESS, A CASE STUDY ACROSS A NORMAL FAULT IN THE LOWER RHINE EMBAYMENT, GERMANY
Auteur: Hinzen, Klaus-G.
Weber, Bernd
Scherbaum, Frank
Verschenen in: Journal of earthquake engineering
Paginering: Jaargang 8 (2004) nr. 6 pagina's 909-926
Jaar: 2004-11-01
Inhoud: In recent years, H/V measurements have been increasingly used to map the thickness of sediment fill in sedimentary basins in the context of seismic hazard assessment. This parameter is believed to be an important proxy for the site effects in sedimentary basins (e.g. in the Los Angeles basin). Here we present the results of a test using this approach across an active normal fault in a structurally well known situation. Measurements on a 50 km long profile with 1 km station spacing clearly show a change in the frequency of the fundamental peak of H/V ratios with increasing thickness of the sediment layer in the eastern part of the Lower Rhine Embayment. Subsequently, a section of 10 km length across the Erft-Sprung system, a normal fault with ca. 750 m vertical offset, was measured with a station distance of 100 m. Frequencies of the first and second peaks and the first trough in the H/V spectra are used in a simple resonance model to estimate depths of the bedrock. While the frequency of the first peak shows a large scatter for sediment depths larger than ca. 500 m, the frequency of the first trough follows the changing thickness of the sediments across the fault. The lateral resolution is in the range of the station distance of 100 m. A power law for the depth dependence of the S-wave velocity derived from down hole measurements in an earlier study [Budny, 1984] and power laws inverted from dispersion analysis of micro array measurements [Scherbaum et aL, 2002] agree with the results from the H/V ratios of this study.
Uitgever: Taylor & Francis
Bronbestand: Elektronische Wetenschappelijke Tijdschriften
 
 

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