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Details van artikel 19 van 31 gevonden artikelen
| Titel: |
Interfacial structure and ferroelectric properties of PZT/SrRuO3 heterostructures on miscut (001)SrTiO3 |
| Auteur: |
Wasa, K. Ichikawa, Y. Adachi, H. Kanno, I. Setsune, K. Schlom, D. G. Trolier-Mckinstry, S. Gan, Q. Eom, C. B. |
| Verschenen in: |
Integrated ferroelectrics |
| Paginering: | Jaargang 26 (1999) nr. 1-4 pagina's 39-46 |
| Jaar: |
1999-10-01 |
| Inhoud: |
A heterostructure of (001)PZT(53/47)/(110)SrRuO3(SRO) was deposited on a miscut (001)SrTiO3(ST) substrate by a magnetron sputtering. The film thickness of the PZT and SRO ranged from 100nm to 200nm. The miscut angles were typically 1.7°. The heterostructure was grown on the miscut ST substrates under a step-flow growth. The heterostructure was tightly bonded to the ST substrate without an interfacial layer. The sputtered PZT thin films were tetragonally deformed with c=4.16 Å (bulk c-lattice parameter, 4.14 Å). A room temperature dielectric constant of the PZT thin films was 200 to 300 at 1kHz. The P/E hysteresis measurements indicated that the saturation polarization Ps was 40 μ C/cm2 with a coercive field Ec of 400 kV/cm to 500 kV/cm. The Ec observed was one order of magnitude higher than a bulk value for PZT. The high values of Ec were observed in a perfect c-domain orientation without an interfacial layer or 90° domains. |
| Uitgever: |
Taylor & Francis |
| Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
Details van artikel 19 van 31 gevonden artikelen
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