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Details for article 1 of 31 found articles
| Title: |
An optimized package test methodology for testing FRAM® memories |
| Author: |
Mitra, Sanjay Humes, James |
| Appeared in: |
Integrated ferroelectrics |
| Paging: | Volume 26 (1999) nr. 1-4 pages 297-310 |
| Year: |
1999-10-01 |
| Contents: |
As the market for ferroelectric semiconductor memories matures, the FRAM® products manufactured by Ramtron International Corp are moving into mass production. In this scenario, the optimization of the production test flow becomes a key consideration in the profitability of the product. Ramtron International Corp has thus been focussing on developing an optimized production test flow without compromising the final quality of the product. |
| Publisher: |
Taylor & Francis |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 31 found articles
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