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Details for article 2 of 37 found articles
| Title: |
Analysis of electrical switching in sub-micron KNO3 thin films |
| Author: |
Godfrey, R. Bruce Scott, J. F. Meadows, H. Brett Golabi, Manooch Araujo, C. McMillan, L. |
| Appeared in: |
Ferroelectrics letters section |
| Paging: | Volume 5 (1986) nr. 6 pages 167-172 |
| Year: |
1986-04-01 |
| Contents: |
The coercive field of KNO3 films 75 to 400nm thick is found to satisfy the empirical relation EC ∼d -1.3, where d is the thickness, in agreement with earlier work on BaTiO3 by Stadler and on TGS by Hadni et al. The switching times for large area devices (20Ox200μm) vary as E-1.5 in agreement with early work on BaTiO3 by Stadler and Zachmanidis, and indicate that the limiting parameter is the velocity of domain growth perpendicular t o the applied field. |
| Publisher: |
Taylor & Francis |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 37 found articles
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