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| Titel: |
Domain formation in thin ferroelectric films: The role of depolarization energy |
| Auteur: |
Kopal, A. Bahnik, T. Fousek, J. |
| Verschenen in: |
Ferroelectrics |
| Paginering: | Jaargang 202 (1997) nr. 1 pagina's 267-274 |
| Jaar: |
1997-10-01 |
| Inhoud: |
Formulae for equlibrium stripe domain width Weq in a nonductive ferroelectric plate of thickness d are deduced, taking into account electrostatic interaction of surfaces. It is shown that the classical formula giving Weq ∞ d1/2 is not applicable when the sample thickness decreases below the value dcrit which is a function of dielectric properties and domain wall energy density. For many ferroelectrics the value of dcrit lies in a range which can be easily reached far below the transition point by contemporary thin film techniques; it further increases as the transition point is approached. In the region d < dcrit the width Weq increases with decreasing d. For samples with thickness d << dcrit the domain structure becomes insensitive to electrical boundary conditions and will be primarily determined by other factors. |
| Uitgever: |
Taylor & Francis |
| Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
Details van artikel 4 van 36 gevonden artikelen
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