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                                       Details for article 5 of 8 found articles
 
 
  RADIATION THERMOMETRY OF SILICON WAFERS IN A DIFFUSION FURNACE WITH ROD-TYPE AND PRISM-TYPE OPTICAL GUIDES
 
 
Title: RADIATION THERMOMETRY OF SILICON WAFERS IN A DIFFUSION FURNACE WITH ROD-TYPE AND PRISM-TYPE OPTICAL GUIDES
Author: Watanabe, Tomoji
Hirasawa, Shigeki
Torii, Takuji
Takagaki, Tetsuya
Appeared in: Experimental heat transfer
Paging: Volume 3 (1990) nr. 4 pages 371-376
Year: 1990-11-01
Contents: This article examines the accuracy of radiation thermometry in measuring the temperature of silicon wafers in a diffusion furnace. This technique uses optical guides to bring thermal radiation from the wafers to the outside of the furnace. The error due to veiling glare of a rod-type optical guide is 40°C and that of a prism-type is 0.5°C at steady state.
Publisher: Taylor & Francis
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 5 of 8 found articles
 
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