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Details for article 7 of 18 found articles
| Title: |
Multivariate process capability a bayesian perspective |
| Author: |
Niverthi, Murali Dey, Dipak K. |
| Appeared in: |
Communications in statistics |
| Paging: | Volume 29 (2000) nr. 2 pages 667-687 |
| Year: |
2000 |
| Contents: |
In this paper an attempt has been made to examine the multivariate versions of the common process capability indices (PCI's) denoted by Cp and Cpk. Markov chain Monte Carlo (MCMC) methods are used to generate sampling distributions for the various PCI's from where inference is performed. Some Bayesian model checking techniques are developed and implemented to examine how well our model fits the data. Finally the methods are exemplified on a historical aircraft data set collected by the Pratt and Whitney Company. |
| Publisher: |
Taylor & Francis |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 18 found articles
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