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                                       Details for article 8 of 8 found articles
 
 
  Time-of-Flight Secondary Ion Mass Spectroscopy with Bismuth Primary Ions of Clean and Air-Exposed Surfaces of Tellurium
 
 
Title: Time-of-Flight Secondary Ion Mass Spectroscopy with Bismuth Primary Ions of Clean and Air-Exposed Surfaces of Tellurium
Author: Trzyna, Malgorzata
Berchenko, Nicolas
Rading, Derk
Cebulski, Jozef
Appeared in: European journal of mass spectrometry
Paging: Volume 20 (2014) nr. 6 pages 429-436
Year: 2014-12
Contents:
Publisher: SAGE Publications, Sage UK: London, England
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 8 of 8 found articles
 
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