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                                       Details for article 5 of 15 found articles
 
 
  An image–temperature model of a microprobe used in wafer testing constructed by particle swarm optimization algorithm
 
 
Title: An image–temperature model of a microprobe used in wafer testing constructed by particle swarm optimization algorithm
Author: Chiang, Yuan-Ching
Chiu, Jinn-Tong
Chang, Zhi-Jie
Chang, Dar-Yuan
Appeared in: Proceedings of the institution of mechanical engineers. Part C: Journal of mechanical engineering science
Paging: Volume 231 (2017) nr. 18 pages 3429-3442
Year: 2017-09
Contents:
Publisher: SAGE Publications, Sage UK: London, England
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 5 of 15 found articles
 
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