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Journal description
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Details for article 8 of 9 found articles
| Title: |
Scanning electron microscopy study of failure in glass-sealed SiC/SiC-based composite (NUSK-CMC) creep tested at 1100 and 1200°C in air |
| Author: |
Davies, I. J. Ogasawara, T. Ishikawa, T. |
| Appeared in: |
Advanced composite materials |
| Paging: | Volume 10 (2001) nr. 4 pages 357-367 |
| Year: |
2001-12-01 |
| Contents: | |
| Publisher: |
Brill, Leiden/Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 9 found articles
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