Infrared and X-ray photoelectron spectroscopy of aminophenyltrimethoxysilane films on metals
Titel:
Infrared and X-ray photoelectron spectroscopy of aminophenyltrimethoxysilane films on metals
Auteur:
Chen, R.Department of Materials Science and Engineering, University of Cincinnati, Cincinnati, OH 45221, USA Boerio, F.J.Department of Materials Science and Engineering, University of Cincinnati, Cincinnati, OH 45221, USA