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Journal description
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Details for article 13 of 197 found articles
| Title: |
Analysis of atomic force microscopy data for deformable materials |
| Author: |
Rutland, Mark Tyrrell, James Attard, Phil |
| Appeared in: |
Journal of adhesion science and technology |
| Paging: | Volume 18 (2004) nr. 10 pages 1199-1215 |
| Year: |
2004-09-15 |
| Contents: | |
| Publisher: |
Brill, Leiden/Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 13 of 197 found articles
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