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Journal description
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Details for article 11 of 25 found articles
| Title: |
Kramers-Krönig Analysis of a-Si/SiNx Interface Structure |
| Author: |
Houjou, Hirohiko Otsuka, Yuji Tanii, Yoshiharu Hinoshita, Chiaki Horii, Seiichirou Murata, Yukio |
| Appeared in: |
Journal of electron microscopy |
| Paging: | Volume 44 (1995) nr. 5 pages 414-418 |
| Year: |
1995-10 |
| Contents: | |
| Publisher: |
Oxford University Press, Oxford |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 25 found articles
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