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                                       Details for article 12 of 16 found articles
 
 
  Reconstruction of LSI Concave Microstructures by Parameter Sensitivity Search in the Best-Fitting Method
 
 
Title: Reconstruction of LSI Concave Microstructures by Parameter Sensitivity Search in the Best-Fitting Method
Author: Nakamae, Koji
Sugimoto, Hiroshi
Fujioka, Hiromu
Appeared in: Journal of electron microscopy
Paging: Volume 43 (1994) nr. 6 pages 356-360
Year: 1994-12
Contents:
Publisher: Oxford University Press, Oxford
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 12 of 16 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands