|
| << previous |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 11 of 11 found articles
| Title: |
Transmission Electron Microscope Sample Preparation Using a Focused Ion Beam |
| Author: |
Ishitani, Thoru Tsuboi, Hideki Yaguchi, Toshie Koike, Hidemi |
| Appeared in: |
Journal of electron microscopy |
| Paging: | Volume 43 (1994) nr. 5 pages 322-326 |
| Year: |
1994-10 |
| Contents: | |
| Publisher: |
Oxford University Press, Oxford |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 11 found articles
| << previous |