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                                       Details for article 2 of 15 found articles
 
 
  Applications of Convergent Beam Electron Diffraction to Extract Quantitative Information in Materials Science
 
 
Title: Applications of Convergent Beam Electron Diffraction to Extract Quantitative Information in Materials Science
Author: Tomokiyo, Yoshitsugu
Appeared in: Journal of electron microscopy
Paging: Volume 41 (1992) nr. 6 pages 403-413
Year: 1992-12
Contents:
Publisher: Oxford University Press, Oxford
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 2 of 15 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands