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Journal description
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Details for article 7 of 9 found articles
| Title: |
Many-beam Effects on Thickness Fringes in a Silicon Wedge Crystal |
| Author: |
IZUI, Kazuhiko NISHIDA, Takahiko FURUNO, Shigemi |
| Appeared in: |
Journal of electron microscopy |
| Paging: | Volume 22 (1973) nr. 4 pages 329-336 |
| Year: |
1973-NaN |
| Contents: | |
| Publisher: |
Oxford University Press, Oxford |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 9 found articles
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