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Journal description
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Details for article 1 of 6 found articles
| Title: |
A High Resolution Electron Interference Microscope and Its Application to the Measurement of Mean Inner Potential |
| Author: |
YADA, Keiji SHIBATA, Kichiro HIBI, Tadatosi |
| Appeared in: |
Journal of electron microscopy |
| Paging: | Volume 22 (1973) nr. 3 pages 223-230 |
| Year: |
1973-NaN |
| Contents: | |
| Publisher: |
Oxford University Press, Oxford |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 6 found articles
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