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Redetermination of the crystal structure of R5Si4 (R = Pr, Nd) from single-crystal X-ray diffraction data |
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Titel: |
Redetermination of the crystal structure of R5Si4 (R = Pr, Nd) from single-crystal X-ray diffraction data |
Auteur: |
Yokota, Kaori Watanuki, Ryuta Nakashima, Miki Uehara, Masatomo Gouchi, Jun Uwatoko, Yoshiya Umehara, Izuru |
Verschenen in: |
Acta crystallographica. Section E, Crystallographic Communications |
Paginering: |
Jaargang 76 () nr. 4 pagina's 510-513 |
Jaar: |
2020-04-01 |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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