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Observation of effect of temperature on X-ray diffraction intensities across the In K absorption edge of InSb |
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Titel: |
Observation of effect of temperature on X-ray diffraction intensities across the In K absorption edge of InSb |
Auteur: |
Fukamachi, T. Kawamura, T. Hayakawa, K. Nakano, Y. Koh, F. |
Verschenen in: |
Acta crystallographica. Section A, Crystal physics, diffraction, theoretical and general crystallography |
Paginering: |
Jaargang 38 (1982) nr. 6 pagina's 810-813 |
Jaar: |
1982-01-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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