X-ray intensity measurements on large crystals by energy-dispersive diffractometry. IV. Determination of anomalous scattering factors near the absorption edges of GaAs by the one-intensity-ratio method
Titel:
X-ray intensity measurements on large crystals by energy-dispersive diffractometry. IV. Determination of anomalous scattering factors near the absorption edges of GaAs by the one-intensity-ratio method
Auteur:
Fukamachi, T. Hosoya, S. Kawamura, T. Okunuki, M.
Verschenen in:
Acta crystallographica. Section A, Crystal physics, diffraction, theoretical and general crystallography
Paginering:
Jaargang 35 (1979) nr. 5 pagina's 828-831
Jaar:
1979-09-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England