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Double-crystal spectrometer measurements of lattice parameters and X-ray topography on heterojunctions GaAs–AlxGa1−xAs |
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Title: |
Double-crystal spectrometer measurements of lattice parameters and X-ray topography on heterojunctions GaAs–AlxGa1−xAs |
Author: |
Estop, E. Izrael, A. Sauvage, M. |
Appeared in: |
Acta crystallographica. Section A, Crystal physics, diffraction, theoretical and general crystallography |
Paging: |
Volume 32 (1976) nr. 4 pages 627-630 |
Year: |
1976-07-01 |
Contents: |
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Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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