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  A determination of thin oxide film thickness by integrated intensity measurements
 
 
Title: A determination of thin oxide film thickness by integrated intensity measurements
Author: Borie, B.
Sparks, C. J.
Appeared in: Acta crystallographica
Paging: Volume 14 (1961) nr. 6 pages 569-570
Year: 1961-06-00
Contents:
Publisher: International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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