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Mapping of a particular element using an absorption edge with an X-ray fluorescence imaging microscope |
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Titel: |
Mapping of a particular element using an absorption edge with an X-ray fluorescence imaging microscope |
Auteur: |
Yamamoto, Kimitake Watanabe, Norio Takeuchi, Akihisa Takano, Hidekazu Aota, Tatsuya Fukuda, Masanori Aoki, Sadao |
Verschenen in: |
Journal of synchrotron radiation |
Paginering: |
Jaargang 7 (2000) nr. 1 pagina's 34-39 |
Jaar: |
2000-01-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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