Hyper-resolution in X-ray emission spectroscopy: integrating extended-range high energy resolution fluorescence detection and multiple-crystal spectrometry with advanced binary data splicing
Titel:
Hyper-resolution in X-ray emission spectroscopy: integrating extended-range high energy resolution fluorescence detection and multiple-crystal spectrometry with advanced binary data splicing
Auteur:
Rijal, Ramesh Stephens, Jack Sier, Daniel Tran, Nicholas T. T. Nguyen, Truong V. B. Dean, Jonathan W. Bowman, Pierce Dao, Minh Di Pasquale, Paul Kirk, Tony Tran, Chanh Q. Hayama, Shusaku Aramini, Matteo Ramanan, Nitya Diaz-Moreno, Sofia Chantler, Christopher T.
Verschenen in:
Journal of synchrotron radiation
Paginering:
Jaargang 32 () nr. 4 pagina's 994-1009
Jaar:
2025-07-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England