|
Double-edge scan wavefront metrology and its application in crystal diffraction wavefront measurements |
|
|
|
Titel: |
Double-edge scan wavefront metrology and its application in crystal diffraction wavefront measurements |
Auteur: |
Liu, Fang Li, Ming Diao, Qianshun Li, Zhe Shen, Zhibang Li, Fan Hong, Zhen Lian, Hongkai Yue, Shuaipeng Hou, Qingyan Zhang, Changrui Zhang, Dongni Li, Congcong Yang, Fugui Yang, Junliang |
Verschenen in: |
Journal of synchrotron radiation |
Paginering: |
Jaargang 31 () nr. 5 pagina's 1146-1153 |
Jaar: |
2024-09-01 |
Inhoud: |
|
Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
|
|
|
|