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Details for article 10 of 20 found articles
| Title: |
In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy |
| Author: |
Lotze, Gudrun Iyer, Anand H. S. Bäcke, Olof Kalbfleisch, Sebastian Colliander, Magnus Hörnqvist |
| Appeared in: |
Journal of synchrotron radiation |
| Paging: | Volume 31 () nr. 1 pages 42-54 |
| Year: |
2024-01-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 20 found articles
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