Statistical analysis of hard X-ray radiation at the PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry
Titel:
Statistical analysis of hard X-ray radiation at the PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry
Auteur:
Kim, Young Yong Khubbutdinov, Ruslan Carnis, Jerome Kim, Sangsoo Nam, Daewoong Nam, Inhyuk Kim, Gyujin Shim, Chi Hyun Yang, Haeryong Cho, Myunghoon Min, Chang-Ki Kim, Changbum Kang, Heung-Sik Vartanyants, Ivan A.
Verschenen in:
Journal of synchrotron radiation
Paginering:
Jaargang 29 () nr. 6 pagina's 1465-1479
Jaar:
2022-01-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England