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Details for article 34 of 35 found articles
| Title: |
Trace-element XAFS sensitivity: a stress test for a new XRF multi-detector |
| Author: |
Carlomagno, Ilaria Antonelli, Matias Aquilanti, Giuliana Bellutti, Pierluigi Bertuccio, Giuseppe Borghi, Giacomo Cautero, Giuseppe Cirrincione, Daniela de Giudici, Giovanni Ficorella, Francesco Gandola, Massimo Giuressi, Dario Medas, Daniela Mele, Filippo Menk, Ralf H. Olivi, Luca Orzan, Giulio Picciotto, Antonino Podda, Francesca Rachevski, Alexandre Rashevskaya, Irina Stebel, Luigi Vacchi, Andrea Zampa, Gianluigi Zampa, Nicola Zorzi, Nicola Meneghini, Carlo |
| Appeared in: |
Journal of synchrotron radiation |
| Paging: | Volume 28 () nr. 6 pages 1811-1819 |
| Year: |
2021-01-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 34 of 35 found articles
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