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A refraction correction for buried interfaces applied to in situ grazing-incidence X-ray diffraction studies on Pd electrodes |
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Titel: |
A refraction correction for buried interfaces applied to in situ grazing-incidence X-ray diffraction studies on Pd electrodes |
Auteur: |
Landers, Alan T. Koshy, David M. Lee, Soo Hong Drisdell, Walter S. Davis, Ryan C. Hahn, Christopher Mehta, Apurva Jaramillo, Thomas F. |
Verschenen in: |
Journal of synchrotron radiation |
Paginering: |
Jaargang 28 () nr. 3 pagina's 919-923 |
Jaar: |
2021-05-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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