Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source
Titel:
Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source
Auteur:
Moxham, Thomas E. J. Parsons, Aaron Zhou, Tunhe Alianelli, Lucia Wang, Hongchang Laundy, David Dhamgaye, Vishal Fox, Oliver J. L. Sawhney, Kawal Korsunsky, Alexander M.
Verschenen in:
Journal of synchrotron radiation
Paginering:
Jaargang 27 () nr. 6 pagina's 1688-1695
Jaar:
2020-01-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England